Trukhin, V. N.; Zinov’ev, N. N.; Andrianov, A. V.; Samoilov, L. L.; Golubok, A. O.; Felshtyn, M. L.; Sapozhnikov, I. D.; Bykov, V. A.; Trukhin, A. V.
(Новосибирский государственный университет, 2010)
We present the terahertz (THz) scanning probe microscope which combines a THz coherent spectrometer and a scanning probe microscope. It detects forward-scattered radiation and employs harmonic signal demodulation to extract ...